Learn how Bruker’s InSight systems ensure pristine wafer surfaces, improving bond integrity and yield in advanced semiconductor packaging.

Recently, a new approach for optimization of conditional value-at-risk (CVAR) was suggested and tested with several applications. For continuous distributions, CVAR is defined as the expected loss ...

A framework based on advanced AI techniques can solve complex, computationally intensive problems faster and in a more more scalable way than state-of-the-art methods, according to a new study. A ...

CODE V version 10.3, now available from Synopsys, delivers new design and analysis capabilities that enable optical designers to better design, analyze, and tolerance non-spherical surfaces.